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Μέρος αριθΕφαρμογή
MN5150H High-speed 8-bit A/D converter
MN5296 16-bit A/D converter
MN2200H/B High-performance instrumentation amplifier
MN2310H High-performance instrumentation amplifier
DAC88H/B 12-bit D/A converter
MN5253H/B Low-power CMOS, 12-bit A/D converter
MN3004H/B High-accuracy 10-bit D/A converter
MN347H High-speed track-hold amplifier
MN3396 20-bit digital-to-analog converter
MN5200H/BCH 12-bit military A/D converter
DACHK-2H 12-bit D/A converter
MN5296H/BCH 16-bit A/D converter
MN6291S/B Low-distortion sampling 16 bit A/D converter
MN5251H Low-power CMOS, 12-bit A/D converter
ADC85C-12 High-speed,12-bit A/D converter
MN5250H Low-power CMOS, 12-bit A/D converter
MN346 High-speed track-hold amplifier
MN5250 Low-power CMOS, 12-bit A/D converter
MN2312 High-performance instrumentation amplifier
MN5100H/BCH High-speed 8-bit A/D converter
MN3014H/B High-speed 8-bit D/A converter
MN5201H 12-bit military A/D converter
MN5252 Low-power CMOS, 12-bit A/D converter
MN7150-16H/BCH 16-channel 12-bit data acquisition system
MN6450S/BCH 16 bit self-calibrating sampling A/D converter
MN7150-16 16-channel 12-bit data acquisition system
MN6400S 16 bit self-calibrating sampling A/D converter
MN6291J Low-distortion sampling 16 bit A/D converter

Micro Networks Προφίλ

Micro Networks, an Integrated Device Technology Company, supplies high-performance, high-reliability data conversion products (amplifiers, A/D and D/A converters) and custom ASIC and MCM modules for weapons and flight control systems to prime contractors. Also available to prime contractors are SAW filters, dispersive delay lines, pulse compression systems, compressive receiver subsystems and SAW switched filter banks for microwave radar and missile guidance systems. Additionally, Micro Networks Creative Electric provides Bulk Acoustic Wave (BAW) Delay Lines, SAW-based Steel Delay Lines, Oscillators, Filters, Subsystems, Legacy Radar Component and Subsystem Repairs, Custom Automated Test Stations, Contract Manufacturing (Build-to-Print), MIL-STD Paint Shop, and Environmental Testing.

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