SN74ABT16823DL Παρόμοια

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
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- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ABT16823DL Datasheet και Spec

Κατασκευαστής : TI

Πακετάρισμα : DL

Pins : 56

Θερμοκρασία : Min -40 °C | Max 85 °C

Μέγεθος : 146 KB

Εφαρμογή : 18-BIT BUS INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS