SN74BCT125ADR Παρόμοια

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
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- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
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- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
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- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74BCT125ADR Datasheet και Spec

Κατασκευαστής : TI

Πακετάρισμα :

Pins : 14

Θερμοκρασία : Min 0 °C | Max 70 °C

Μέγεθος : 79 KB

Εφαρμογή : QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS