SN74CBT3383DBQR Παρόμοια

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    • SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
  • SN74ABT623N
    • OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
  • SN74AHC541PWR
    • OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
  • SN74S260D
    • DUAL 5-INPUT POSITIVE-NOR GATES
  • SN74LVTH16652DLR
    • 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
  • SN7405N3
    • HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
  • SN74AHC74PWLE
    • DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
  • SN74HC02DBR
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74CBT3383DBQR Datasheet και Spec

Κατασκευαστής : TI 

Πακετάρισμα : DBQ 

Pins : 24 

Θερμοκρασία : Min 0 °C | Max 70 °C

Μέγεθος : 73 KB

Εφαρμογή : 10-BIT FET BUS-EXCHANGE SWITCHES 

SN74CBT3383DBQR PDF Κατεβάστε

SN74CBT3383DBQR PDF