SN74LVC112ADBLE spec: DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP WITH CLEAR AND PRESET

SN74LVC112ADBLE Παρόμοια

SN74BCT8374ADWR
- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74ABT623N
- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74AHC541PWR
- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN74S260D
- DUAL 5-INPUT POSITIVE-NOR GATES
SN74LVTH16652DLR
- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
SN7405N3
- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74LVC112ADBLE Datasheet και Spec

Κατασκευαστής : TI

Πακετάρισμα : DB

Pins : 16

Θερμοκρασία : Min -40 °C | Max 85 °C

Μέγεθος : 140 KB

Εφαρμογή : DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP WITH CLEAR AND PRESET