SN74LVTH244ADWR Παρόμοια

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74LVTH244ADWR Datasheet και Spec

Κατασκευαστής : TI

Πακετάρισμα : DW

Pins : 20

Θερμοκρασία : Min -40 °C | Max 85 °C

Μέγεθος : 102 KB

Εφαρμογή : 3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS